Semiconductor Reliability, V2 - Paperback
Semiconductor Reliability, V2 - Paperback
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by William H. Von Alven (Editor), E. J. Nucci (Foreword by)
Additional Contributors Include A. Procassini, A. Romano, Lawrence F. Jones And Others.
Number of Pages: 416
Dimensions: 0.85 x 9.02 x 5.98 IN
Publication Date: May 18, 2013
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